org.rcsb.cif.schema.mm.EmDiffraction Maven / Gradle / Ivy
package org.rcsb.cif.schema.mm;
import org.rcsb.cif.model.*;
import org.rcsb.cif.schema.*;
import javax.annotation.Generated;
/**
* Microscopy parameters relevant only for crystallography
*/
@Generated("org.rcsb.cif.schema.generator.SchemaGenerator")
public class EmDiffraction extends DelegatingCategory {
public EmDiffraction(Category delegate) {
super(delegate);
}
@Override
protected Column createDelegate(String columnName, Column column) {
switch (columnName) {
case "camera_length":
return getCameraLength();
case "id":
return getId();
case "imaging_id":
return getImagingId();
case "tilt_angle_list":
return getTiltAngleList();
default:
return new DelegatingColumn(column);
}
}
/**
* The camera length (in millimeters). The camera length is the
* product of the objective focal length and the combined magnification
* of the intermediate and projector lenses when the microscope is
* operated in the diffraction mode.
* @return FloatColumn
*/
public FloatColumn getCameraLength() {
return delegate.getColumn("camera_length", DelegatingFloatColumn::new);
}
/**
* PRIMARY KEY
* @return StrColumn
*/
public StrColumn getId() {
return delegate.getColumn("id", DelegatingStrColumn::new);
}
/**
* Foreign key to the EM_IMAGING category
* @return StrColumn
*/
public StrColumn getImagingId() {
return delegate.getColumn("imaging_id", DelegatingStrColumn::new);
}
/**
* Comma-separated list of tilt angles (in degrees) used in the electron diffraction experiment.
* @return StrColumn
*/
public StrColumn getTiltAngleList() {
return delegate.getColumn("tilt_angle_list", DelegatingStrColumn::new);
}
}