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package org.rcsb.cif.schema.mm;
import org.rcsb.cif.model.*;
import org.rcsb.cif.schema.*;
import javax.annotation.Generated;
/**
* Data items in the EM_IMAGING category record details about
* the parameters used in imaging the sample in the electron microscope.
*/
@Generated("org.rcsb.cif.schema.generator.SchemaGenerator")
public class EmImaging extends DelegatingCategory {
public EmImaging(Category delegate) {
super(delegate);
}
@Override
protected Column createDelegate(String columnName, Column column) {
switch (columnName) {
case "entry_id":
return getEntryId();
case "id":
return getId();
case "astigmatism":
return getAstigmatism();
case "electron_beam_tilt_params":
return getElectronBeamTiltParams();
case "residual_tilt":
return getResidualTilt();
case "sample_support_id":
return getSampleSupportId();
case "detector_id":
return getDetectorId();
case "scans_id":
return getScansId();
case "microscope_id":
return getMicroscopeId();
case "microscope_model":
return getMicroscopeModel();
case "specimen_holder_type":
return getSpecimenHolderType();
case "specimen_holder_model":
return getSpecimenHolderModel();
case "details":
return getDetails();
case "date":
return getDate();
case "accelerating_voltage":
return getAcceleratingVoltage();
case "illumination_mode":
return getIlluminationMode();
case "mode":
return getMode();
case "nominal_cs":
return getNominalCs();
case "nominal_defocus_min":
return getNominalDefocusMin();
case "nominal_defocus_max":
return getNominalDefocusMax();
case "calibrated_defocus_min":
return getCalibratedDefocusMin();
case "calibrated_defocus_max":
return getCalibratedDefocusMax();
case "tilt_angle_min":
return getTiltAngleMin();
case "tilt_angle_max":
return getTiltAngleMax();
case "nominal_magnification":
return getNominalMagnification();
case "calibrated_magnification":
return getCalibratedMagnification();
case "electron_source":
return getElectronSource();
case "electron_dose":
return getElectronDose();
case "energy_filter":
return getEnergyFilter();
case "energy_window":
return getEnergyWindow();
case "citation_id":
return getCitationId();
case "temperature":
return getTemperature();
case "detector_distance":
return getDetectorDistance();
case "recording_temperature_minimum":
return getRecordingTemperatureMinimum();
case "recording_temperature_maximum":
return getRecordingTemperatureMaximum();
case "alignment_procedure":
return getAlignmentProcedure();
case "c2_aperture_diameter":
return getC2ApertureDiameter();
case "specimen_id":
return getSpecimenId();
case "cryogen":
return getCryogen();
default:
return new DelegatingColumn(column);
}
}
/**
* This data item is a pointer to _entry.id in the ENTRY category.
* @return StrColumn
*/
public StrColumn getEntryId() {
return delegate.getColumn("entry_id", DelegatingStrColumn::new);
}
/**
* PRIMARY KEY
* @return StrColumn
*/
public StrColumn getId() {
return delegate.getColumn("id", DelegatingStrColumn::new);
}
/**
* astigmatism
* @return StrColumn
*/
public StrColumn getAstigmatism() {
return delegate.getColumn("astigmatism", DelegatingStrColumn::new);
}
/**
* electron beam tilt params
* @return StrColumn
*/
public StrColumn getElectronBeamTiltParams() {
return delegate.getColumn("electron_beam_tilt_params", DelegatingStrColumn::new);
}
/**
* Residual tilt of the electron beam (in miliradians)
* @return FloatColumn
*/
public FloatColumn getResidualTilt() {
return delegate.getColumn("residual_tilt", DelegatingFloatColumn::new);
}
/**
* This data item is a pointer to _em_sample_support.id in
* the EM_SAMPLE_SUPPORT category.
* @return StrColumn
*/
public StrColumn getSampleSupportId() {
return delegate.getColumn("sample_support_id", DelegatingStrColumn::new);
}
/**
* The value of _em_imaging.detector_id must uniquely identify
* the type of detector used in the experiment.
* @return StrColumn
*/
public StrColumn getDetectorId() {
return delegate.getColumn("detector_id", DelegatingStrColumn::new);
}
/**
* The value of _em_imaging.scans_id must uniquely identify
* the image_scans used in the experiment.
* @return StrColumn
*/
public StrColumn getScansId() {
return delegate.getColumn("scans_id", DelegatingStrColumn::new);
}
/**
* This data item is a pointer to _em_microscope.id in
* the EM_MICROSCOPE category.
* @return StrColumn
*/
public StrColumn getMicroscopeId() {
return delegate.getColumn("microscope_id", DelegatingStrColumn::new);
}
/**
* The name of the model of microscope.
* @return StrColumn
*/
public StrColumn getMicroscopeModel() {
return delegate.getColumn("microscope_model", DelegatingStrColumn::new);
}
/**
* The type of specimen holder used during imaging.
* @return StrColumn
*/
public StrColumn getSpecimenHolderType() {
return delegate.getColumn("specimen_holder_type", DelegatingStrColumn::new);
}
/**
* The name of the model of specimen holder used during imaging.
* @return StrColumn
*/
public StrColumn getSpecimenHolderModel() {
return delegate.getColumn("specimen_holder_model", DelegatingStrColumn::new);
}
/**
* Any additional imaging details.
* @return StrColumn
*/
public StrColumn getDetails() {
return delegate.getColumn("details", DelegatingStrColumn::new);
}
/**
* Date (YYYY-MM-DD) of imaging experiment or the date at which
* a series of experiments began.
* @return StrColumn
*/
public StrColumn getDate() {
return delegate.getColumn("date", DelegatingStrColumn::new);
}
/**
* A value of accelerating voltage (in kV) used for imaging.
* @return IntColumn
*/
public IntColumn getAcceleratingVoltage() {
return delegate.getColumn("accelerating_voltage", DelegatingIntColumn::new);
}
/**
* The mode of illumination.
* @return StrColumn
*/
public StrColumn getIlluminationMode() {
return delegate.getColumn("illumination_mode", DelegatingStrColumn::new);
}
/**
* The mode of imaging.
* @return StrColumn
*/
public StrColumn getMode() {
return delegate.getColumn("mode", DelegatingStrColumn::new);
}
/**
* The spherical aberration coefficient (Cs) in millimeters,
* of the objective lens.
* @return FloatColumn
*/
public FloatColumn getNominalCs() {
return delegate.getColumn("nominal_cs", DelegatingFloatColumn::new);
}
/**
* The minimum defocus value of the objective lens (in nanometers) used
* to obtain the recorded images. Negative values refer to overfocus.
* @return FloatColumn
*/
public FloatColumn getNominalDefocusMin() {
return delegate.getColumn("nominal_defocus_min", DelegatingFloatColumn::new);
}
/**
* The maximum defocus value of the objective lens (in nanometers) used
* to obtain the recorded images. Negative values refer to overfocus.
* @return FloatColumn
*/
public FloatColumn getNominalDefocusMax() {
return delegate.getColumn("nominal_defocus_max", DelegatingFloatColumn::new);
}
/**
* The minimum calibrated defocus value of the objective lens (in nanometers) used
* to obtain the recorded images. Negative values refer to overfocus.
* @return FloatColumn
*/
public FloatColumn getCalibratedDefocusMin() {
return delegate.getColumn("calibrated_defocus_min", DelegatingFloatColumn::new);
}
/**
* The maximum calibrated defocus value of the objective lens (in nanometers) used
* to obtain the recorded images. Negative values refer to overfocus.
* @return FloatColumn
*/
public FloatColumn getCalibratedDefocusMax() {
return delegate.getColumn("calibrated_defocus_max", DelegatingFloatColumn::new);
}
/**
* The minimum angle at which the specimen was tilted to obtain
* recorded images.
* @return FloatColumn
*/
public FloatColumn getTiltAngleMin() {
return delegate.getColumn("tilt_angle_min", DelegatingFloatColumn::new);
}
/**
* The maximum angle at which the specimen was tilted to obtain
* recorded images.
* @return FloatColumn
*/
public FloatColumn getTiltAngleMax() {
return delegate.getColumn("tilt_angle_max", DelegatingFloatColumn::new);
}
/**
* The magnification indicated by the microscope readout.
* @return IntColumn
*/
public IntColumn getNominalMagnification() {
return delegate.getColumn("nominal_magnification", DelegatingIntColumn::new);
}
/**
* The magnification value obtained for a known standard just
* prior to, during or just after the imaging experiment.
* @return IntColumn
*/
public IntColumn getCalibratedMagnification() {
return delegate.getColumn("calibrated_magnification", DelegatingIntColumn::new);
}
/**
* The source of electrons. The electron gun.
* @return StrColumn
*/
public StrColumn getElectronSource() {
return delegate.getColumn("electron_source", DelegatingStrColumn::new);
}
/**
* The electron dose received by the specimen (electrons per square angstrom).
* @return FloatColumn
*/
public FloatColumn getElectronDose() {
return delegate.getColumn("electron_dose", DelegatingFloatColumn::new);
}
/**
* The type of energy filter spectrometer apparatus.
* @return StrColumn
*/
public StrColumn getEnergyFilter() {
return delegate.getColumn("energy_filter", DelegatingStrColumn::new);
}
/**
* The energy filter range in electron volts (eV)set by spectrometer.
* @return StrColumn
*/
public StrColumn getEnergyWindow() {
return delegate.getColumn("energy_window", DelegatingStrColumn::new);
}
/**
* This data item is a pointer to _citation.id in
* the CITATION category.
* @return StrColumn
*/
public StrColumn getCitationId() {
return delegate.getColumn("citation_id", DelegatingStrColumn::new);
}
/**
* The mean specimen stage temperature (in kelvin) during imaging
* in the microscope.
* @return FloatColumn
*/
public FloatColumn getTemperature() {
return delegate.getColumn("temperature", DelegatingFloatColumn::new);
}
/**
* The camera length (in millimeters). The camera length is the
* product of the objective focal length and the combined magnification
* of the intermediate and projector lenses when the microscope is
* operated in the diffraction mode.
* @return FloatColumn
*/
public FloatColumn getDetectorDistance() {
return delegate.getColumn("detector_distance", DelegatingFloatColumn::new);
}
/**
* The specimen temperature minimum (kelvin) for the duration
* of imaging.
* @return FloatColumn
*/
public FloatColumn getRecordingTemperatureMinimum() {
return delegate.getColumn("recording_temperature_minimum", DelegatingFloatColumn::new);
}
/**
* The specimen temperature maximum (kelvin) for the duration
* of imaging.
* @return FloatColumn
*/
public FloatColumn getRecordingTemperatureMaximum() {
return delegate.getColumn("recording_temperature_maximum", DelegatingFloatColumn::new);
}
/**
* The type of procedure used to align the microscope electron beam.
* @return StrColumn
*/
public StrColumn getAlignmentProcedure() {
return delegate.getColumn("alignment_procedure", DelegatingStrColumn::new);
}
/**
* The open diameter of the c2 condenser lens,
* in microns.
* @return FloatColumn
*/
public FloatColumn getC2ApertureDiameter() {
return delegate.getColumn("c2_aperture_diameter", DelegatingFloatColumn::new);
}
/**
* Foreign key to the EM_SPECIMEN category
* @return StrColumn
*/
public StrColumn getSpecimenId() {
return delegate.getColumn("specimen_id", DelegatingStrColumn::new);
}
/**
* Cryogen type used to maintain the specimen stage temperature during imaging
* in the microscope.
* @return StrColumn
*/
public StrColumn getCryogen() {
return delegate.getColumn("cryogen", DelegatingStrColumn::new);
}
}
