org.rcsb.cif.schema.mm.EmFocusedIonBeam Maven / Gradle / Ivy
package org.rcsb.cif.schema.mm;
import org.rcsb.cif.model.*;
import org.rcsb.cif.schema.*;
import javax.annotation.Generated;
/**
* Description of sectioning by focused_ion_beam
*/
@Generated("org.rcsb.cif.schema.generator.SchemaGenerator")
public class EmFocusedIonBeam extends DelegatingCategory {
public EmFocusedIonBeam(Category delegate) {
super(delegate);
}
@Override
protected Column createDelegate(String columnName, Column column) {
switch (columnName) {
case "current":
return getCurrent();
case "details":
return getDetails();
case "dose_rate":
return getDoseRate();
case "duration":
return getDuration();
case "em_tomography_specimen_id":
return getEmTomographySpecimenId();
case "final_thickness":
return getFinalThickness();
case "id":
return getId();
case "initial_thickness":
return getInitialThickness();
case "instrument":
return getInstrument();
case "ion":
return getIon();
case "temperature":
return getTemperature();
case "voltage":
return getVoltage();
default:
return new DelegatingColumn(column);
}
}
/**
* Current of the ion beam, in nanoamperes (nA)
* @return FloatColumn
*/
public FloatColumn getCurrent() {
return delegate.getColumn("current", DelegatingFloatColumn::new);
}
/**
* Additional details about FIB milling
* @return StrColumn
*/
public StrColumn getDetails() {
return delegate.getColumn("details", DelegatingStrColumn::new);
}
/**
* ions per sq centimetre per second
* @return IntColumn
*/
public IntColumn getDoseRate() {
return delegate.getColumn("dose_rate", DelegatingIntColumn::new);
}
/**
* Milling time in seconds
* @return FloatColumn
*/
public FloatColumn getDuration() {
return delegate.getColumn("duration", DelegatingFloatColumn::new);
}
/**
* Foreign key relationship to the EM TOMOGRAPHY SPECIMEN category
* @return StrColumn
*/
public StrColumn getEmTomographySpecimenId() {
return delegate.getColumn("em_tomography_specimen_id", DelegatingStrColumn::new);
}
/**
* Final sample thickness
* @return IntColumn
*/
public IntColumn getFinalThickness() {
return delegate.getColumn("final_thickness", DelegatingIntColumn::new);
}
/**
* PRIMARY KEY
* @return StrColumn
*/
public StrColumn getId() {
return delegate.getColumn("id", DelegatingStrColumn::new);
}
/**
* Initial sample thickness
* @return IntColumn
*/
public IntColumn getInitialThickness() {
return delegate.getColumn("initial_thickness", DelegatingIntColumn::new);
}
/**
* The instrument used for focused ion beam sectioning
* @return StrColumn
*/
public StrColumn getInstrument() {
return delegate.getColumn("instrument", DelegatingStrColumn::new);
}
/**
* The ion source used to ablate the specimen
* @return StrColumn
*/
public StrColumn getIon() {
return delegate.getColumn("ion", DelegatingStrColumn::new);
}
/**
* Temperature of the sample during milling, in kelvins
* @return IntColumn
*/
public IntColumn getTemperature() {
return delegate.getColumn("temperature", DelegatingIntColumn::new);
}
/**
* Voltage applied to the ion source, in kilovolts
* @return IntColumn
*/
public IntColumn getVoltage() {
return delegate.getColumn("voltage", DelegatingIntColumn::new);
}
}